Description
The book "Electron Microscopy and Analysis 1997" is a collection of papers presented at the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Cambridge. It commemorates the centenary anniversary of the discovery of the electron and the fiftieth anniversary of the Institute group. The book covers topics such as the early history of electron microscopy, the development of the scanning electron microscope, electron energy loss spectroscopy, imaging methods, and the future of electron microscopy. It also discusses various applications of advanced techniques in physics, materials science, metallurgy, and surface science. The book serves as a useful reference for professionals using microscopes to gain an understanding of materials microstructure and advancements in microscope interrogation techniques.
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
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